Nanostructure of the interpenetrating networks in poly(3-hexylthiophene)/fullerene bulk heterojunction materials: Implications for charge transport

被引:51
作者
Ma, Wanli
Gopinathan, Ajay
Heeger, Alan J. [1 ]
机构
[1] Univ Calif Santa Barbara, Ctr Polymers & Organ Solids, Santa Barbara, CA 93106 USA
[2] Univ California Merced, Sch Nat Sci, Merced, CA 95343 USA
关键词
D O I
10.1002/adma.200700019
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The fractal dimension, chemical distance, and finally the effect of an applied electric field on the transport within the interpenetrating network of poly (3-hexylthiophene)/fullerene bulk heterojunction materials are calculated. According to simulations, charge carriers travel along a pathway similar to 4 times longer than the regular Euclidean distance. In an applied electric field, the drift speed of charged carriers is reduced because of field-induced trapping on the tortuous network.
引用
收藏
页码:3656 / +
页数:5
相关论文
共 7 条
[1]  
[Anonymous], FRACTALS CHANCE DIME
[2]   RANDOM-WALK ON PERCOLATION CLUSTERS [J].
ARGYRAKIS, P ;
KOPELMAN, R .
PHYSICAL REVIEW B, 1984, 29 (01) :511-514
[3]   Ambipolar organic field-effect transistors fabricated using a composite of semiconducting polymer and soluble fullerene [J].
Cho, Shinuk ;
Yuen, Jonathan ;
Kim, Jin Young ;
Lee, Kwanghee ;
Heeger, Alan J. .
APPLIED PHYSICS LETTERS, 2006, 89 (15)
[4]   THE FRACTAL DIMENSION OF THE MINIMUM PATH IN TWO-DIMENSIONAL AND 3-DIMENSIONAL PERCOLATION [J].
HERRMANN, HJ ;
STANLEY, HE .
JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1988, 21 (17) :L829-L833
[5]   Thermally stable, efficient polymer solar cells with nanoscale control of the interpenetrating network morphology [J].
Ma, WL ;
Yang, CY ;
Gong, X ;
Lee, K ;
Heeger, AJ .
ADVANCED FUNCTIONAL MATERIALS, 2005, 15 (10) :1617-1622
[6]   Effects of postproduction treatment on plastic solar cells [J].
Padinger, F ;
Rittberger, RS ;
Sariciftci, NS .
ADVANCED FUNCTIONAL MATERIALS, 2003, 13 (01) :85-88
[7]   DIMENSION OF STRANGE ATTRACTORS [J].
RUSSELL, DA ;
HANSON, JD ;
OTT, E .
PHYSICAL REVIEW LETTERS, 1980, 45 (14) :1175-1178