Terahertz radiation mechanism from femtosecond-laser-irradiated InAs (100) surface

被引:21
作者
Takahashi, H [1 ]
Quema, A
Goto, M
Ono, S
Sarukura, N
机构
[1] Grad Univ Adv, Dept Photo Sci, Shonan Village, Hayama 2400193, Japan
[2] IMS, Okazaki, Aichi 4448585, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2003年 / 42卷 / 10B期
关键词
terahertz radiation; semiconductor surface; InAs; Ti : sapphire laser; photo-Dember field;
D O I
10.1143/JJAP.42.L1259
中图分类号
O59 [应用物理学];
学科分类号
摘要
Terahertz (THz) radiation mechanism from femtosecond-laser-irradiated InAs surface is investigated by measuring the excitation-fluence dependence of THz-radiation power. It is found that the THz-radiation is mainly generated by the surge-current, which originates from the different diffusion velocities between photoexcited electrons and holes. Furthermore, it is also found that the excitation fluence dependence of THz-radiation is categorized into two regions depending on the excitation fluence. At low excitation fluence, a quadratic-dependent enhancement of the THz-radiation power is observed with increasing excitation fluence. In contrast, at high excitation fluence, the enhancement factor is gradually reduced, and the radiation power becomes proportional to a logarithm function of the excitation fluence. These results are explained by considering the photo-Dember field as the THz-radiation source.
引用
收藏
页码:L1259 / L1261
页数:3
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