Phonon dispersion curves in wurtzite-structure GaN determined by inelastic x-ray scattering

被引:164
作者
Ruf, T
Serrano, J
Cardona, M
Pavone, P
Pabst, M
Krisch, M
D'Astuto, M
Suski, T
Grzegory, I
Leszczynski, M
机构
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[2] Univ Regensburg, Inst Theoret Phys, D-93040 Regensburg, Germany
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[4] Polish Acad Sci, UNIPRESS, High Pressure Res Ctr, PL-01142 Warsaw, Poland
关键词
D O I
10.1103/PhysRevLett.86.906
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have investigated the lattice dynamics of a wurtzite GaN single crystal by inelastic x-ray scattering. Several dispersion branches and phonons at high-symmetry points have been measured, including the two zone-center Raman- and infrared-inactive silent modes. The experiments have been complemented by ab initio calculations. They are in very good agreement with our measurements, not only for phonon energies, but also for scattering intensities, thus validating the correctness of the eigenvectors. Other phenomenological and ab initio theories exhibit significant differences.
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收藏
页码:906 / 909
页数:4
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