Progress in the atomic-scale analysis of materials with the three-dimensional atom probe

被引：13

作者：

Cerezo, A ^{[1
]}

Larson, DJ

Smith, GDW

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 2JD, England

[2] Seagate Technol, Recording Head Operat, Bloomington, IN USA

来源：

MRS BULLETIN | 2001年 / 26卷 / 02期

关键词：

D O I：

10.1557/mrs2001.296

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：102 / 107

页数：6

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