Structure refinement of titanium carbonitride (TiCN)

被引：109

作者：

Levi, G ^{[1
]}

Kaplan, WD ^{[1
]}

Bamberger, M ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel

来源：

MATERIALS LETTERS | 1998年 / 35卷 / 5-6期

关键词：

TiCN; Rietveld; XRPD;

D O I：

10.1016/S0167-577X(97)00276-0

中图分类号：

T [工业技术];

学科分类号：

08 [工学];

摘要：

Rietveld structure refinement was conducted on X-ray powder diffraction data of TiCN. The existing structural model for TiCN, based on a cubic lattice with random occupation of sites by Ti, C and N, was found to be incorrect. The TiCN structure is better described based on the TiN structure (NaCl type) with substitution of N by C. Rietveld refinement showed that only a low concentration of vacancies exists in the nonmetallic sublattice. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：344 / 350

页数：7

共 10 条

[1]

Adjaottor AA, 1995, SURF COAT TECH, V76, P142, DOI 10.1016/0257-8972(95)02594-4

[2]

ALYAMOVSKII SI, 1973, TEPLOFIZ VYS TEMP, V11, P680

[3]

Optical emission spectroscopy of active species in a TiCN PVD are discharge [J].

Baravian, G ;

Sultan, G ;

Damond, E ;

Detour, H ;

Hayaud, C ;

Jacquot, P .

SURFACE & COATINGS TECHNOLOGY, 1995, 76-77 (1-3) :687-693

[4]

CHECHENTSEV VN, 1988, LITEINOYE PROIZVODST, V9, P7

[5]

HOWARD CJ, 1986, M112 AUSTR AT EN COM

[6]

KIEFFER R, 1972, METALL, V26, P701

[7]

VILLARS P, 1995, HDB TERNARY ALLOY PH, V6, P7155

[8]

Villars P., 1985, PEARSONS HDB CRYSTAL

[9]

A NEW COMPUTER-PROGRAM FOR RIETVELD ANALYSIS OF X-RAY-POWDER DIFFRACTION PATTERNS [J].

WILES, DB ;

YOUNG, RA .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1981, 14 (APR) :149-151

[10]

Young RA., 1993, The Rietveld Method, DOI [10.1093/oso/9780198555773.001.0001, DOI 10.1093/OSO/9780198555773.001.0001]

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