Extraction of inner shell from multiwall carbon nanotubes for scanning probe microscope tip

We demonstrate a novel method for providing a capped sharp probe for a scanning probe microscope based on the extraction of the inner shell of the multiwall nanotube using a combination of well-controlled electrical breakdown and manipulation processes inside the scanning electron microscope. The measured sliding force for the extraction of the inner shell is consistent with the theoretical prediction based on the van der Waals interaction between the inner and the outer shells of the nanotube. Hence, the proposed process realizes the ideal sliding of the interlayer of the nanotube.