An investigation of the electron irradiation of carbon blacks in various gas atmospheres using a modified electron microscope

被引：6

作者：

Burden, AP ^{[1
]}

Baigrie, S ^{[1
]}

Hutchison, JL ^{[1
]}

机构：

[1] Printable Field Emitters Ltd, Atlas Ctr, Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1998年 / 192卷

关键词：

carbon black; chemical sputtering; in situ high-resolution transmission electron microscopy; radiation damage;

D O I：

10.1046/j.1365-2818.1998.00400.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The behaviour of carbon black particles immersed in a variety of gases and simultaneously irradiated with an electron beam has been investigated. Because this treatment was performed in a modified high-resolution transmission electron microscope, the remarkable morphological and microstructural changes that occurred could be observed directly. In addition to the physical damage to the specimens, believed to be caused by a high flux of low energy ions generated by the electron beam, the use of reactive gases in this study exposed additional chemical sputtering effects that will be of importance for future controlled-environment microscopy.

引用

页码：7 / 19

页数：13

共 26 条

[1] CONTROLLED ATMOSPHERE ELECTRON-MICROSCOPY [J].