A two-dimensional fast Fourier transform method for measuring the inclination angle of parallel fringe patterns

被引：20

作者：

De Nicola, S

Ferraro, P

机构：

[1] CNR, Ist Cibernet, I-80072 Arco, Italy

[2] Ist Profess Stato Ind & Artigianato GL Bernini, I-80122 Naples, Italy

来源：

OPTICS AND LASER TECHNOLOGY | 1998年 / 30卷 / 3-4期

关键词：

interferogram processing; phase retrieval; Fourier transform;

D O I：

10.1016/S0030-3992(98)00028-0

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this paper we describe a technique based on two-dimensional fast Fourier fringe pattern analysis for the automated evaluation of the inclination angle of parallel fringe patterns. Analysis of noise-free theoretical parallel fringe patterns is presented and numerical results of the angle evaluation error using this algorithm are discussed. We also demonstrate an application of the method to the measurement of the inclination angle of experimental parallel fringe patterns. (C) 1998 Elsevier Science Ltd. All rights reserved.

引用

页码：167 / 173

页数：7

共 13 条

[1]

CHANG CW, 1989, OPT COMMUN, V73, P257, DOI 10.1016/0030-4018(89)90213-7

[2] A new approach to high accuracy measurement of the focal lengths of lenses using a digital Fourier transform [J].