A nested finite element methodology (NFEM) for stress analysis of electronic products - Part I: Theory and formulation

被引:4
作者
Darbha, K [1 ]
Dasgupta, A [1 ]
机构
[1] Univ Maryland, CALCE Elect Prod & Syst Ctr, College Pk, MD 20742 USA
关键词
D O I
10.1115/1.1328744
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
In this gaper, the authors present a stress analysis technique based on a novel nested finite element methodology (NFEM). The NFEM is similar in concept to an earlier. proposed multi-domain Rayleigh-Ritz methodology (Ling, S., 1997, "A Multi-Domain Rayleigh-Ritz Method for Thermomechanical Stress Analysis of Surface Mount Interconnects in Electronic Assemblies," Ph.D. dissertation, Univ., of Maryland), that is based on a nested multi-field displacement assumption. The nested multifield displacement technique may be viewed as a localized cascading of the p-type refinement in conventional finite element analysis. The concept and formulation of NFEM are presented in this paper while the application of NFEM to analyze the viscoplastic stress-state in two popular surface mount electronic interconnect styles is presented in Part II of this series. To illustrate the concept of NFEM, the formulation and results are provided for a one-dimensional viscoplastic example.
引用
收藏
页码:141 / 146
页数:6
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