Fabric defect classification using radial basis function network

被引:49
作者
Zhang, Yu [1 ]
Lu, Zhaoyang [1 ]
Li, Jing [1 ]
机构
[1] Xidian Univ, State Key Lab Integrated Serv Networks, Xian 710071, Peoples R China
关键词
Fabric defect classification; Radial basis function network; Gaussian mixture model; Feature extraction; Pattern classification; WAVELET PACKET FRAME; PATTERN-CLASSIFICATION; TEXTURE CLASSIFICATION; AUTOMATED INSPECTION; NEURAL-NETWORK; SYSTEM;
D O I
10.1016/j.patrec.2010.05.030
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
In this paper, a new approach for fabric defect classification using radial basis function (RBF) network improved by Gaussian mixture model (GMM) is investigated. First, the gray level arrangement in the neighborhood of each pixel is extracted as the feature. This raw feature is subject to principal component analysis (PCA) which adopts the between class scatter matrix as the generation matrix to eliminate the variance within the same class. Second, the RBF network with Gaussian kernel is used as the classifier because of the nonlinear discrimination ability and support for multi-output. To train the classifier. GMM is introduced to cluster the feature set and precisely estimate the parameter in Gaussian RBF, in which each cluster strictly conforms to a multi-variance Gaussian distribution. Thus the parameter of each kernel function in RBF network can be acquired from a corresponding cluster. The proposed algorithm is experimented on fabric defect images with nine classes and achieves superior performance, which proves its utility in practice. (c) 2010 Elsevier By. All rights reserved.
引用
收藏
页码:2033 / 2042
页数:10
相关论文
共 31 条
[1]  
[Anonymous], 1995, Markov Random Field Modeling in Computer Vision
[2]  
Bilmes J.A, 1998, GENTLE TUTORIAL EM A
[3]   Optimal Gabor filters for textile flaw detection [J].
Bodnarova, A ;
Bennamoun, M ;
Latham, S .
PATTERN RECOGNITION, 2002, 35 (12) :2973-2991
[4]  
Bouman C.A. S.M, 1995, CLUSTER UNSUPERVISED
[5]  
Broomhead D. S., 1988, Complex Systems, V2, P321
[6]   Fabric defect detection by Fourier analysis [J].
Chan, CH ;
Pang, GKH .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2000, 36 (05) :1267-1276
[7]   AUTOMATED INSPECTION OF TEXTILE FABRICS USING TEXTURAL MODELS [J].
COHEN, FS ;
FAN, ZG ;
ATTALI, S .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1991, 13 (08) :803-808
[8]   IDENTIFYING AND LOCATING SURFACE-DEFECTS IN WOOD - PART OF AN AUTOMATED LUMBER PROCESSING SYSTEM [J].
CONNERS, RW ;
MCMILLIN, CW ;
LIN, K ;
VASQUEZESPINOSA, RE .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1983, 5 (06) :573-583
[9]   GEOMETRICAL AND STATISTICAL PROPERTIES OF SYSTEMS OF LINEAR INEQUALITIES WITH APPLICATIONS IN PATTERN RECOGNITION [J].
COVER, TM .
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1965, EC14 (03) :326-&
[10]   Intelligent Visual Recognition and Classification of Cork Tiles With Neural Networks [J].
Georgieva, Antoniya ;
Jordanov, Ivan .
IEEE TRANSACTIONS ON NEURAL NETWORKS, 2009, 20 (04) :675-685