128-x128-element silicon microlens array fabricated by ion beam etching for PtSi IRCCD
被引:4
作者:
Zhang, XY
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机构:
Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R ChinaHuazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R China
Zhang, XY
[1
]
Yi, XJ
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机构:
Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R ChinaHuazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R China
Yi, XJ
[1
]
He, M
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机构:
Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R ChinaHuazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R China
He, M
[1
]
Zhao, XG
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机构:
Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R ChinaHuazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R China
Zhao, XG
[1
]
机构:
[1] Huazhong Univ Sci & Technol, Dept Optoelect Engn, Wuhan 430074, Peoples R China
来源:
INTEGRATED OPTOELECTRONICS II
|
1998年
/
3551卷
关键词:
microlens array;
microstructure;
PtSi IRCCD;
D O I:
10.1117/12.317989
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
A silicon refractive microlens array mounted on a 128-x128-element PtSi IR CCD focal-plane architecture is fabricated using a multiple-process, including photolithography, heat treatment, and argon ion beam etching techniques. The optical filling factor of PtSi IR CCD with refractive microlens array is more than 95 percent. The focal length of the square-base arch silicon microlens is' about 90 mu m. Both the scanning electron microscope and the surface style measurement are carried out to determine the dimensions and the surface morphology of silicon refractive microlens. The matching properties between the preshaped photoresist mask and silicon substrate during argon ion beam etching are given. The techniques utilized can be applied to fabricate microtips array and microplateforms (circle microtips) array.