Growth of group III nitrides. A review of precursors and techniques

被引:280
作者
Neumayer, DA [1 ]
Ekerdt, JG [1 ]
机构
[1] UNIV TEXAS, SCI & TECHNOL CTR SYNTH GROWTH & ANAL ELECTR MAT, AUSTIN, TX 78712 USA
关键词
D O I
10.1021/cm950108r
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The AlGaInN quaternary alloy system is uniquely suited for numerous device applications because the bandgap can be varied from 1.9 to 6.2 eV by changing the alloy composition. Growth of epitaxial device-quality group III (Al, Ga, In) nitride films has been hindered by a lack of suitably lattice matched substrates, the large equilibrium dissociation pressure of Na from the nitrides at typical growth temperatures, and predeposition reactions in the commonly employed metal-organic chemical vapor (MOCVD) precursors. The most successful films have been grown at temperatures in excess of 900 degrees C by MOCVD. However, high growth temperatures may limit compatibility and incorporation of group III nitrides with existing fabrication technologies and devices. Attempts to lower deposition temperature include activated nitrogen sources and alternative precursors. This review will discuss improvement in film properties as a function of growth chemistry and will focus on MOCVD precursors used specifically for the growth of group III nitrides.
引用
收藏
页码:9 / 25
页数:17
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