Comparison of a delB drift effect model with measured H-mode power thresholds

被引:24
作者
Carlstrom, TN [1 ]
Burrell, KH [1 ]
Groebner, RJ [1 ]
机构
[1] Gen Atom Co, San Diego, CA 92186 USA
关键词
D O I
10.1088/0741-3335/40/5/020
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The H-mode power threshold has a weak but positive B-T dependence when the ion del B drift is away from the X-point, in contrast to the nearly linear BT dependence when the ion del B drift is toward the X-point. This indicates that geometry plays an important role in the H-mode power threshold scaling. A simple model of the del B drift effect failed to predict this behaviour, but successfully predicted the sign change of gas puffing and low X-point height on the power threshold. The difference between the threshold power required for sawtooth and non-sawtooth-triggered transitions can be substantial. This effect may contribute to the observed B scaling of the H-mode power threshold.
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页码:669 / 672
页数:4
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