Microlens arrays with integrated pores as a multipattern photomask

被引:24
作者
Yang, S
Ullal, CK
Thomas, EL
Chen, G
Aizenberg, J
机构
[1] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA
[2] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[3] Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1926405
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photolithographic masks are key components in the fabrication process of patterned substrates for various applications. Different patterns generally require different photomasks, whose total cost is high for the multilevel fabrication of three-dimensional microstructures. We developed a photomask that combines two imaging elements-microlens arrays and clear windows-in one structure. Such structures can be produced using multibeam interference lithography. We demonstrate their application as multipattern photomasks; that is, by using the same photomask and simply adjusting (i) the illumination dose, (ii) the distance between the mask and the photoresist film, and (iii) the tone of photoresist, we are able to create a variety of different microscale patterns with controlled sizes, geometries, and symmetries that originate from the lenses, clear windows, or their combination. The experimental results agree well with the light field calculations. (c) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
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