Proximity communication

被引:38
作者
Drost, RJ [1 ]
Hopkins, RD [1 ]
Sutherland, IE [1 ]
机构
[1] Sun Microsyst Inc, Mountain View, CA 94043 USA
来源
PROCEEDINGS OF THE IEEE 2003 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2003年
关键词
D O I
10.1109/CICC.2003.1249442
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports results from wireless chip to chip communication experiments. Sixteen bit words pass from one chip to another in parallel without detectable error at 1.35 billion data items per second for a total data rate of 21.6 Gigabits per second. The experiment transmits pseudo random patterns between chips built in 350nm CMOS technology. Chips touch face-to-face to communicate. The same pseudo random data pattern is loaded onto both chips so that the receiving chip can check the accuracy of every bit communicated. Each communication channel consumes a static power of 3.6 milliWatts, and a dynamic power of 3.9 picoJoules per bit communicated. The channels lie on 50 micron centers. Because the capacitive communication works through covering oxide, ESD protection is unnecessary. Vernier position measuring circuits built into the chips indicate the relative position of transmitting and receiving arrays to assist mechanical alignment. The test chip includes a Vernier circuit that provides inter-chip position measurements with a resolution of 1.4 microns.
引用
收藏
页码:469 / 472
页数:4
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