CCD drift-scan imaging lunar occultations:: A feasible approach for sub-meter class telescopes

被引:10
作者
Fors, O
Núñez, J
Richichi, A
机构
[1] Univ Barcelona, Dept Astron & Meteorol, E-08028 Barcelona, Spain
[2] Observ Fabra, Barcelona 08035, Spain
[3] European So Observ, D-85748 Garching, Germany
关键词
instrumentation : detectors; techniques : high angular resolution occultations; stars : fundamental parameters; stars : binaries : general;
D O I
10.1051/0004-6361:20011239
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
A CCD drift-scanning technique for lunar occultation (LO) observations is presented. While this approach has been addressed before by Sturmann (1994) for the case of large telescopes, the technical validity has never been discussed for sub-meter class telescopes. In contrast to Sturmann's scheme, the proposed technique places the CCD in the image plane of the telescope. This does not represent a problem in the case of small telescopes, where the practical angular resolution attainable by LO is not limited by aperture smoothing. Photon-generated charge is read out at millisecond rates on a column by column basis, as the diffraction pattern of the occulted star is being tracked. Two LO events (SAO 79031 and SAO 77911) were observed to demonstrate the feasibility of the method. Data analysis was carried out, yielding unresolved angular diameters for both objects. We show, however, that the technique could be useful for close binary detections with small telescopes. A discussion of the limiting resolution and magnitude imposed by our instrumentation is carried out, showing that the drift-scanning technique could be extended to 1-2 m telescopes for stellar diameter determination purposes. Finally, we point out that the technical demands required by this technique can be easily met by most small professional observatories and advanced amateurs.
引用
收藏
页码:1100 / 1106
页数:7
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