Percolative growth of palladium ultrathin films deposited by plasma sputtering

被引:41
作者
Brault, P
Thomann, AL
Andreazza-Vignolle, C
机构
[1] Univ Orleans, CNRS, UMR 6606, Grp Rech Energet Milieux Ionises, F-45067 Orleans 2, France
[2] Univ Orleans, CNRS, UMR 6619, Ctr Rech Mat Divisee, F-45067 Orleans, France
关键词
amorphous surface; atom-solid reaction; carbon; clusters; diffusion and migration; growth; metallic films; models of surface kinetics; palladium; scanning transmission electron microscopy; surface defects;
D O I
10.1016/S0039-6028(98)00241-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Palladium ultrathin films have been deposited by a plasma sputtering technique. In a first step, small particles (mean diameter d<3 nm), homogeneously distributed on amorphous carbon membrane surfaces. are grown by surface diffusion of Pd atoms. Coalescence starts to form meandering compound clusters. Such Pd clusters, composing the islands, are still enlarging during the deposition. During the coalescence, a percolating network builds up with a measured percolation threshold around p(c)=0.7. The time evolutions of the mean size of the elementary and compound clusters are slightly modified when compared to vacuum deposition and theoretical predictions. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:L597 / L602
页数:6
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