Modulation Z-scan technique for characterization of photorefractive crystals

被引：5

作者：

Aguilar, PAM ^{[1
]}

Mondragon, JJS ^{[1
]}

Stepanov, S ^{[1
]}

机构：

[1] INST NACL ASTROFIS OPT & ELECT, PUEBLA 72000, MEXICO

来源：

OPTICS LETTERS | 1996年 / 21卷 / 19期

关键词：

D O I：

10.1364/OL.21.001541

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a simple single-beam configuration for characterization of the amplitude, speed of growth, and polarization properties of the photoinduced refractive-index change that is due to a drift photorefractive mechanism of nonlinearity in crystals, namely, the modulation Z-scan technique, based on the modulation of an externally applied electric field. The results of a simple theoretical model developed for one-dimensional parabolic photorefractive lens formation in this configuration are illustrated by original experiments with a semi-insulating GaAs crystal at lambda = 1.06 mu m. (C) 1996 Optical Society of America

引用

页码：1541 / 1543

页数：3

共 14 条

[1]

AGUILAR PAM, 1966, OSA TECHNICAL DIGEST, V10, P212

[2]

AGUILAR PAM, 1995, ULTRASENSITIVE LASER, V118, P165

[3] (1+1)-DIMENSION DARK SPATIAL SOLITONS IN PHOTOREFRACTIVE BI12TIO20 CRYSTAL [J].