Parametric optimization of microhardness of diamond-like carbon films prepared by plasma enhanced chemical vapor deposition

被引:12
作者
Bao, T
Morrison, PW
Woyczynski, WA [1 ]
机构
[1] Motorola Adv Prod, Res & Dev Lab, Austin, TX 78752 USA
[2] Case Western Reserve Univ, Dept Chem Engn, Cleveland, OH 44106 USA
[3] Case Western Reserve Univ, Dept Stat, Cleveland, OH 44106 USA
[4] Case Western Reserve Univ, Ctr Stochast & Chaot Proc Sci & Technol, Cleveland, OH 44106 USA
基金
美国国家科学基金会;
关键词
diamond-like (DLC) carbon films; parametric optimization; microhardness; chemical vapor deposition (CVD);
D O I
10.1016/j.tsf.2005.03.026
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Diamond-like amorphous carbon (DLC) thin films may have high hardness and low surface roughness depending on the deposition process parameters. A systematic parametric study of DLC films deposited by plasma enhanced chemical vapor deposition was conducted. Atomic force microscopy was applied to characterize the film microhardness and the surface mean roughness.. The complex parametric effects of multiple deposition variables on process' responses (microhardness and mean roughness) were examined using a face-centered central composite response surface experimental design. The directions, magnitudes, and significance of various main and interaction effects on the responses were studied. The response contour plots indicated that a combination of relatively high induction power and low deposition pressure at high bias voltage with low Ar dilution produces DLC films with high hardness. The parametric optimization agreed reasonably well with theoretical predictions. The design of experiments is demonstrated to be a powerful tool in exploration of the parameter space of the complex physical process of DLC film deposition. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:27 / 41
页数:15
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