Fundamental properties of the low voltage power distribution grid used as a data channel

被引：10

作者：

Dostert, K ^{[1
]}

Zimmermann, M ^{[1
]}

Waldeck, T ^{[1
]}

Arzberger, M ^{[1
]}

机构：

[1] Univ Karlsruhe, Inst Ind Informat Syst, D-76187 Karlsruhe, Germany

来源：

EUROPEAN TRANSACTIONS ON TELECOMMUNICATIONS | 2000年 / 11卷 / 03期

关键词：

D O I：

10.1002/ett.4460110307

中图分类号：

TN [电子技术、通信技术];

学科分类号：

0809 ;

摘要：

Recently a steadily increasing interest towards using the low voltage power distribution grid for various communication purposes is noticed. For the construction of appropriate equipment, being able to cope with the properties of such an unusual channel. a thorough understanding of physics is paramount. The work presented in the following describes essential contributions towards modelling basic properties of low voltage energy distribution networks as data channels. New and important measurement results of parameters significantly influencing the performance of communication systems are outlined, covering typical values and properties of network access impedance, propagation characteristics as well as different kinds of interference in the frequency range 20kHz to 150kHz. Furthermore channel model approaches based on the results are discussed.

引用

页码：297 / 306

页数：10

共 8 条

[1]

[Anonymous], P INT S POW LIN COMM

[2] ATTENUATION OF COMMUNICATION SIGNALS ON RESIDENTIAL AND COMMERCIAL INTRABUILDING POWER-DISTRIBUTION CIRCUITS [J].

CHAN, MHL ;

DONALDSON, RW .

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1986, 28 (04) :220-230

[3]

DOSTERT K, 1994, P INT S INF THEOR IT, P1139

[4] RF IMPEDANCE OF UNITED-STATES AND EUROPEAN POWER LINES [J].

MALACK, JA ;

ENGSTROM, JR .

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1976, 18 (01) :36-38

[5] RF IMPEDANCE OF POWER LINES AND LINE IMPEDANCE STABILIZATION NETWORKS IN CONDUCTED INTERFERENCE MEASUREMENTS [J].

NICHOLSON, JR ;

MALACK, JA .

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 1973, EM15 (02) :84-86

[6]

RUSE H, 1991, KLEINHEUBACHER BER, V34, P79

[7]

THREIN G, 1991, VDI FORTSCHRITT B 10

[8]

VINES RM, 1985, IEEE T ELECTROMA FEB, P6

← 1 →