共 18 条
[1]
Epitaxial staircase structure for the calibration of electrical characterization techniques
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1998, 16 (01)
:394-400
[3]
KLEINKNECHT HP, 1988, SCANNING MICROSCOPY, V2, P1839
[4]
Comparison of experimental and theoretical scanning capacitance microscope signals and their impact on the accuracy of determined two-dimensional carrier profiles
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2002, 20 (05)
:2101-2107
[5]
Scanning capacitance microscopy measurements and modeling: Progress towards dopant profiling of silicon
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1996, 14 (01)
:242-247
[6]
Lányi S, 2003, J PHYS D APPL PHYS, V36, P598, DOI 10.1088/0022-3727/36/5/326
[8]
VERY SHARP GOLD AND PLATINUM TIPS TO MODIFY GOLD SURFACES IN SCANNING-TUNNELING-MICROSCOPY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1995, 13 (03)
:1325-1331
[9]
MCMURRAY JS, 2000, THESIS U UTAH
[10]
MCMURRAY JS, 2001, P 6 INT WORKSH FABR, P199