Epitaxial yttria-stabilized zirconia on biaxially-textured (001) Ni for YBCO coated conductor

被引：11

作者：

Park, C ^{[1
]}

Norton, DP ^{[1
]}

Lee, DF ^{[1
]}

Verebelyi, DT ^{[1
]}

Goyal, A ^{[1
]}

Christen, DK ^{[1
]}

Budai, JD ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

PHYSICA C | 2000年 / 341卷

关键词：

D O I：

10.1016/S0921-4534(00)01199-0

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Epitaxial YSZ film was deposited directly on biaxially-textured (001) Mi tapes using pulsed-laser deposition. Nucleation of the YSZ film on Wi is achieved without the intentional removal of the native oxide from the Mi (001) surface. The epitaxial YSZ layer grown on the Wi (001) surface was used as a single buffer layer for a high temperature superconducting coated conductor architecture, yielding YBa2Cu3O7 films with critical current density of 1 MA/cm(2) at 77 K. This architecture eliminates the necessity for a multilayer buffer architecture, as high J(c) superconducting films are achieved with no intermediate buffer layer between the (001) YSZ and the biaxially textured metal.

引用

页码：2481 / 2482

页数：2

共 4 条

[1] TEMPERATURE-DEPENDENCE OF HARDNESS IN YTTRIA-STABILIZED ZIRCONIA SINGLE-CRYSTALS [J].