Quantitative measurement of short-range chemical bonding forces

被引：330

作者：

Lantz, MA ^{[1
]}

Hug, HJ ^{[1
]}

Hoffmann, R ^{[1
]}

van Schendel, PJA ^{[1
]}

Kappenberger, P ^{[1
]}

Martin, S ^{[1
]}

Baratoff, A ^{[1
]}

Güntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

SCIENCE | 2001年 / 291卷 / 5513期

关键词：

D O I：

10.1126/science.1057824

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

We report direct force measurements of the formation of a chemical bond. The experiments were performed using a Low-temperature atomic force microscope, a silicon tip, and a silicon (111) 7x7 surface. The measured site-dependent attractive short-range force, which attains a maximum value of 2.1 nanonewtons, is in good agreement with first-principles calculations of an incipient covalent bond in an analogous model system. The resolution was sufficient to distinguish differences in the interaction potential between inequivalent adatoms, demonstrating the ability of atomic force microscopy to provide quantitative, atomic-scale information on surface chemical reactivity.

引用

页码：2580 / 2583

页数：6

共 28 条

[1]

ABDURIXIT A, UNPUB

[2] Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy [J].