Finite-temperature molecular-dynamics study of unstable stacking fault free energies in silicon

被引:25
作者
de Koning, M
Antonelli, A
Bazant, MZ
Kaxiras, E
Justo, JF
机构
[1] Univ Estadual Campinas, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
[3] Harvard Univ, Div Appl Sci, Cambridge, MA 02138 USA
[4] Univ Sao Paulo, Inst Fis, BR-05315970 Sao Paulo, Brazil
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 19期
关键词
D O I
10.1103/PhysRevB.58.12555
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We calculate the free energies of unstable stacking fault (USF) configurations on the glide and shuffle slip planes in silicon as a function of temperature, using the recently developed environment-dependent interatomic potential (EDIP). We employ the molecular dynamics (MD) adiabatic switching method with appropriate periodic boundary conditions and restrictions to atomic motion that guarantee stability and include volume relaxation of the USF configurations perpendicular to the slip plane. Our MD results using the EDIP model agree fairly well with earlier first-principles estimates for the transition from shuffle to glide plane dominance as a function of temperature. We use these results to make contact to brittle-ductile transition models. [S0163-1829(98)06043-3].
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页码:12555 / 12558
页数:4
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