Quantitative magnetometry using electron holography: Field profiles near magnetic force microscope tips

被引：39

作者：

Streblechenko, DG

Scheinfein, MR

Mankos, M

Babcock, K

机构：

[1] DIGITAL INSTRUMENTS,SANTA BARBARA,CA 93103

[2] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1996年 / 32卷 / 05期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/20.539316

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Magnetic force microscopy offers an inexpensive means of measuring magnetic microstructure with high spatial resolution by scanning a magnetized tip across the surface of a magnetic sample. Contrast in the magnetic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electron holographic methods were used in order to quantitatively determine the fields in proximity to extremely small magnetic force microscope tips.

引用

页码：4124 / 4129

页数：6

共 9 条

[1] FLUX-QUANTIZATION IN MAGNETIC NANOWIRES IMAGED BY ELECTRON HOLOGRAPHY [J].