Rietveld analysis of disordered layer silicates

被引：55

作者：

Bergmann, J ^{[1
]}

Kleeberg, R ^{[1
]}

机构：

[1] Univ Freiberg, Inst Mineral, D-09596 Freiberg, Germany

来源：

EPDIC 5, PTS 1 AND 2 | 1998年 / 278-2卷

关键词：

Rietveld analysis; quantitative analysis; disorder; layer silicates;

D O I：

10.4028/www.scientific.net/MSF.278-281.300

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The new Rietveld program BGMN was used to refine the disordered structures of the layer silicates chlorite and kaolinite, For this purpose, a refineable disordering model was introduced by means of the integrated structure interpreter. Hereby, XRD patterns could be described much better. The program permits the refinement of complicated mixtures including disordered structures without any interaction of the user.

引用

页码：300 / 305

页数：6

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