High-resolution second-harmonic microscopy of poled silica waveguides

被引：16

作者：

Beermann, J

Bozhevolnyi, SI

Pedersen, K

Fage-Pedersen, J

机构：

[1] Aalborg Univ, Inst Phys, DK-9220 Aalborg OST, Denmark

[2] Tech Univ Denmark, COM, DK-2800 Lyngby, Denmark

来源：

OPTICS COMMUNICATIONS | 2003年 / 221卷 / 4-6期

关键词：

scanning optical microscopy; second-harmonic generation;

D O I：

10.1016/S0030-4018(03)01426-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A second-harmonic scanning optical microscopy (SHSOM) apparatus operating in reflection is used for high-resolution imaging of second-order optical non-linearities (SONs) in electric-field poled silica-based waveguides. SHSOM of domain walls in a periodically poled KTiOPO4 crystal is performed, and the spatial resolution at the pump wavelength of 790 nm is determined to be better than 0.7 mum. SHSOM images of positively poled silica waveguides were obtained for different polarization combinations of the incident pump beam and the detected second-harmonic radiation. Calibration of the SHSOM with a GaAs-sample indicates the presence of large (non-uniformly distributed) SONs of similar to10 pm/V in the area of UV-written waveguides. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：295 / 300

页数：6

共 22 条

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