Temperature variation of magnetic aftereffect

被引:13
作者
Della Torre, E [1 ]
Bennett, LH
机构
[1] NIST, Gaithersburg, MD 20899 USA
[2] George Washington Univ, Washington, DC 20052 USA
关键词
accelerated testing; chemical potential; magnetic aftereffect; quantum statistics;
D O I
10.1109/20.920486
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper analyzes the anomalous behavior of the magnetic aftereffect decay coefficient with temperature, which has been established experimentally from a thermodynamic point of view. The Arrhenius law, which has often been used to model magnetic aftereffect, is based on the Maxwell-Boltzmann (MB) statistics. At low temperatures, however, magnons obey Bose-Einstein (BE) statistics, which have a different energy spectrum. MB statistics are a good approximation to BE statistics in the temperature range in which most devices operate. The variation in temperature, governed by chemical potential that is essentially linear, has a negative slope and is zero below a low but finite temperature. Other explanations for this anomalous behavior would predict an incorrect type of temperature dependence. This new interpretation of magnetic aftereffect may have profound implications on accelerated testing to determine life expectancy of recordings.
引用
收藏
页码:1118 / 1122
页数:5
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