Ferroelectric epitaxial nanocrystals obtained by a self-patterning method

被引:126
作者
Szafraniak, I [1 ]
Harnagea, C [1 ]
Scholz, R [1 ]
Bhattacharyya, S [1 ]
Hesse, D [1 ]
Alexe, M [1 ]
机构
[1] Max Planck Inst Microstruct Phys, D-06120 Halle Saale, Germany
关键词
D O I
10.1063/1.1611258
中图分类号
O59 [应用物理学];
学科分类号
摘要
Lead zirconate titanate nanoislands were obtained by a self-patterning method making use of the instability of ultrathin films during high-temperature treatments. After high-temperature annealing, the as-deposited film breaks into islands with a narrow size distribution. The single-crystal nanoislands were studied by scanning and high-resolution transmission electron microscopy, atomic force microscopy, and x-ray diffraction. They show an epitaxial relationship with the Nb-doped (001) SrTiO3 substrate. The ferroelectric switching of several individual islands was investigated by piezoresponse force microscopy. (C) 2003 American Institute of Physics.
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收藏
页码:2211 / 2213
页数:3
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共 18 条
  • [1] The physics of ferroelectric memories
    Auciello, O
    Scott, JF
    Ramesh, R
    [J]. PHYSICS TODAY, 1998, 51 (07) : 22 - 27
  • [2] CHU MC, UNPUB
  • [3] Fujisawa H, 2000, MATER RES SOC SYMP P, V596, P321
  • [4] Observations of island structures at the initial growth stage of PbZrxTi1-xO3 thin films prepared by metalorganic chemical vapor deposition
    Fujisawa, H
    Morimoto, K
    Shimizu, M
    Niu, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (9B): : 5446 - 5450
  • [5] FUJISAWA H, 2001, MATER RES SOC S P, V655
  • [6] Microstructure and growth mode at early growth stage of laser-ablated epitaxial Pb(Zr0.52Ti0.48)O3 films on a SrTiO3 substrate
    Goh, WC
    Xu, SY
    Wang, SJ
    Ong, CK
    [J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (08) : 4497 - 4502
  • [7] Quantitative ferroelectric characterization of single submicron grains in Bi-layered perovskite thin films
    Harnagea, C
    Pignolet, A
    Alexe, M
    Hesse, D
    Gösele, U
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2000, 70 (03): : 261 - 267
  • [8] Piezoresponse scanning force microscopy: What quantitative information can we really get out of piezoresponse measurements on ferroelectric thin films (vol 28, pg 23, 2001)
    Harnagea, C
    Pignolet, A
    Alexe, M
    Hesse, D
    [J]. INTEGRATED FERROELECTRICS, 2002, 44 : 113 - 124
  • [9] Thermally induced structural changes in epitaxial SrZrO3 films on SrTiO3
    Langjahr, PA
    Wagner, T
    Rühle, M
    Lange, FF
    [J]. JOURNAL OF MATERIALS RESEARCH, 1999, 14 (07) : 2945 - 2951
  • [10] Effect of surface relaxations on the equilibrium growth morphology of crystals: platelet formation
    Lee, WT
    Salje, EKH
    Dove, MT
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1999, 11 (38) : 7385 - 7410