Ionic strength effects in polyelectrolyte brushes: The counterion correction

被引:74
作者
Hariharan, R
Biver, C
Russel, WB
机构
[1] GE, Corp Res & Dev, Polymer Mat Lab, Schenectady, NY 12301 USA
[2] Princeton Univ, Dept Chem Engn, Princeton, NJ 08544 USA
[3] Elf Atochem, F-92300 Levallois, France
关键词
D O I
10.1021/ma9718199
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
We propose a means of accounting for the contribution of counterions to the ionic strength within a polyelectrolyte brush, which is then incorporated into models treating the effects of electrostatic interactions, chain stretching, and curvature on the layer thickness for chains attached to a spherical particle. Combining an electrostatic wormlike chain model originated by Odijk, Fixman, and co-workers with the blob model of Daoud and Cotton predicts without adjustable parameters the layer thickness for a wide range of ionic strengths and particle radii. A simplified scaling version that neglects stiffening due to electrostatic interactions greatly underestimates the layer thickness but captures the dependence on ionic strength reasonably.
引用
收藏
页码:7514 / 7518
页数:5
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