Deep wet etching of borosilicate glass using an anodically bonded silicon substrate as mask

被引:88
作者
Corman, T [1 ]
Enoksson, P [1 ]
Stemme, G [1 ]
机构
[1] Royal Inst Technol, Dept Signals Sensors & Syst, S-10044 Stockholm, Sweden
关键词
D O I
10.1088/0960-1317/8/2/010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Deep wet etching of borosilicate glass using an anodically bonded silicon substrate as mask is presented. Depths of 500 mu m or more can be achieved very easily. The structured glass wafer can be bonded anodically on the same side to another silicon wafer, alter having removed the bonded silicon mask. A lateral underetching 1.5 times larger than the depth was measured. An application using this masking technique is also presented. It consists of using the anodically bonded frame of a resonant silicon structure as a mask for deep glass etching to increase the gap between the glass wall and the resonator, thus yielding a high Q-factor.
引用
收藏
页码:84 / 87
页数:4
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