Fault diagnosis for linear analog circuits with symbolic analysis and reduced observable point set

被引：1

作者：

Artioli, M ^{[1
]}

Filippetti, F ^{[1
]}

机构：

[1] Univ Bologna, Dip Ingn Elettr, I-40136 Bologna, Italy

来源：

SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/OLT.2001.937845

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 [计算机科学与技术];

摘要：

The paper is intended to propose a simple method to locate and identify single (and multiple, under some hypothesis)faults in linear electric circuits. Key points of the method are: (1) a simple idea for an easy implementation, (2) a formulation based on Symbolic Analysis to use its great feature of automatically generating equations and its ability to incorporate "non-conventional" algebra, (3) an extension to the Interval Algebra to take into account parameter tolerances and uncertainties for real circuits, (4) the need Of few observable test points to meet real testing requirement cis far as possible. In the following sections the focus will be primary kept on the mathematical formulation, relating to the symbolic approach and the intervals.

引用

页码：215 / 218

页数：4