Atomic scale observation of Cottrell atmospheres in B-doped FeAl (B2) by 3D atom probe field ion microscopy

被引：16

作者：

Cadel, E

Fraczkiewicz, A

Blavette, D

机构：

[1] Ecole Mines, CNRS 1884, URA, F-42100 St Etienne, France

[2] Univ Rouen, CNRS 6634, UMR, Grp Phys Mat, F-76821 Mont St Aignan, France

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2001年 / 309卷

关键词：

field ion microscopy; Cottrell atmosphere; 3DAP;

D O I：

10.1016/S0921-5093(00)01688-9

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Three-dimensional atom probe method (3DAP) coupled with field ion microscopy (FIM) was used to study the nano-scale boron segregation to dislocations in B2-ordered FeAl (40 at.% Al). A boron-rich Cottrell atmosphere near an edge <1 0 0 > dislocation was imaged with atomic resolution and its chemical composition was analysed at local scale. Some macroscopic effects of boron segregation to crystal defects, which are related to the segregation phenomena, are also discussed. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：32 / 37

页数：6

共 20 条

[1]

Baker I, 1997, INT MATER REV, V42, P181, DOI 10.1179/095066097790093190

[2] Three-dimensional atomic-scale imaging of impurity segregation to line defects [J].