Temperature dependence of the permittivity and loss tangent of high-permittivity materials at terahertz frequencies

被引：64

作者：

Berdel, K ^{[1
]}

Rivas, JG

Bolívar, PH

de Maagt, P

Kurz, H

机构：

[1] Rhein Westfal TH Aachen, Inst Halbleitertech, D-52056 Aachen, Germany

[2] Univ Siegen, Inst High Frequency & Quantum Elect, D-57068 Siegen, Germany

[3] European Space Technol Ctr, Electromagnet Div, NL-2210 AG Noordwijk, Netherlands

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2005年 / 53卷 / 04期

关键词：

ceramics; dielectric materials; dielectric thermal factors; measurement; submillimeter waves; titanium compounds;

D O I：

10.1109/TMTT.2005.845752

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An analysis including the temperature dependence of the permittivity and loss tangent of three low-cost and high-permittivity, materials (zirconium-tin-titanate, alumina, and titanium-dioxide) in the terahertz frequency range is presented. Such dielectric materials find varied applications in microwave and terahertz systems and components. Their effective use under varying environmental conditions or in space applications requires a detailed knowledge about temperature dependencies. Here, measurements using broad-band terahertz time-domain spectroscopy are presented in the temperature range from 10 to 323 K. It is shown that zirconium-tin-titanate and alumina provide a good thermal stability of the permittivity, whereas the permittivity of titanium-dioxide exhibits a strong dependence on the temperature.

引用

页码：1266 / 1271

页数：6

共 24 条

[1]

ARLT G, 1989, WERKSTOFFE ELEKTROTE

[2] AN INTERCOMPARISON OF MEASUREMENT TECHNIQUES FOR THE DETERMINATION OF THE DIELECTRIC-PROPERTIES OF SOLIDS AT NEAR MILLIMETER WAVELENGTHS [J].

BIRCH, JR ;

SIMONIS, GJ ;

AFSAR, MN ;

CLARKE, RN ;

DUTTA, JM ;

FROST, HM ;

GERBAUX, X ;

HADNI, A ;

HALL, WF ;

HEIDINGER, R ;

HO, WW ;

JONES, CR ;

KONIGER, F ;

MOORE, RL ;

MATSUO, H ;

NAKANO, T ;

RICHTER, W ;

SAKAI, K ;

STEAD, MR ;

STUMPER, U ;

VIGIL, RS ;

WELLS, TB .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1994, 42 (06) :956-965

[3]

Bolivar PH, 1999, SUSSP PROC, V50, P151

[4] Measurement of the dielectric constant and loss tangent of high dielectric-constant materials at terahertz frequencies [J].

Bolivar, PH ;

Brucherseifer, M ;

Rivas, JG ;

Gonzalo, R ;

Ederra, I ;

Reynolds, AL ;

de Maagt, P .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (04) :1062-1066

[5]

Born M, 1989, PRINCIPLES OPTICS

[6] Layered Al2O3-TiO2 composite dielectric resonators [J].

Breeze, J ;

Penn, SJ ;

Poole, M ;

Alford, NM .

ELECTRONICS LETTERS, 2000, 36 (10) :883-884

[7] Electromagnetic bandgap antennas and components for microwave and (sub)millimeter wave applications [J].

de Maagt, P ;

Gonzalo, R ;

Vardaxoglou, YC ;

Baracco, JM .

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 2003, 51 (10) :2667-2677

[8]

DOERRE E, 1984, ALUMINA

[9] Material parameter estimation with terahertz time-domain spectroscopy [J].

Dorney, TD ;

Baraniuk, RG ;

Mittleman, DM .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (07) :1562-1571

[10]

DUVILLARET L, 1996, IEEE J QUANTUM ELECT, V2, P2006

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