Tapping mode atomic force microscopy on polymers: Where is the true sample surface?

被引：190

作者：

Knoll, A ^{[1
]}

Magerle, R ^{[1
]}

Krausch, G ^{[1
]}

机构：

[1] Univ Bayreuth, Bayreuther Zentrum Kolloide & Grenzflachen, D-95440 Bayreuth, Germany

来源：

MACROMOLECULES | 2001年 / 34卷 / 12期

关键词：

D O I：

10.1021/ma001311x

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

We investigate in detail the processes involved when soft polymeric materials are imaged with TappingMode atomic force microscopy (TM-AFM). Measuring lateral arrays of amplitude/phase vs distance (APD) curves, we are able to determine quantitatively the amount of tip indentation and reconstruct the;shape of the "real" surface of the sample. Moreover, contrast inversion in height and TappingMode phase images is explained on the basis of attractive and repulsive contributions to the tip-sample interaction. The experiments are performed on surfaces of poly(styrene-block-butadiene-block-styrene) (SBS) triblock copolymers acting as a model system.

引用

页码：4159 / 4165

页数：7

共 32 条

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