Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy

被引：43

作者：

Hubert, C ^{[1
]}

Levy, J ^{[1
]}

机构：

[1] Univ Pittsburgh, Dept Phys & Astron, Pittsburgh, PA 15260 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 22期

关键词：

D O I：

10.1063/1.122727

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Images of nanometer-scale ferroelectric domains in BaxSr1-xTiO3 thin films are obtained with 30 Angstrom spatial resolution using apertureless near-field scanning optical microscopy (ANSOM). The images exhibit inhomogeneities in the ferroelectric polarization over the smallest scales that can be observed, and are largely uncorrelated with topographic features. The application of an in-plane static electric field causes domain reorientation and domain-wall motion over distances as small as 40 Angstrom. These results demonstrate the promise of ANSOM for imaging near-atomic-scale polarization fluctuations in ferroelectric materials. (C) 1998 American Institute of Physics. [S0003-6951(98)00947-4].

引用

页码：3229 / 3231

页数：3

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