Study of oxygen tracer diffusion in PrBaCo2O5.74 by SIMS

被引：12

作者：

Frison, R. ^{[2
]}

Portier, S. ^{[1
]}

Martin, M. ^{[1
]}

Conder, K. ^{[2
]}

机构：

[1] Paul Scherrer Inst, Surface Anal Grp, CH-5232 Villigen, Switzerland

[2] Paul Scherrer Inst, Lab Dev & Methods, CH-5232 Villigen, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2012年 / 273卷

关键词：

Perovskite; IEDP; SIMS; Diffusion profiles; SURFACE EXCHANGE; CATHODES; PEROVSKITES; MECHANISMS;

D O I：

10.1016/j.nimb.2011.07.060

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this work we studied oxygen diffusion in polycrystalline PrBaCo2O5+delta by isotope exchange-depth profiling (IEDP). Diffusion profiles of O-18 are produced from Secondary Ion Mass Spectrometry (SIMS) depth profiles. We obtained high values of diffusivity; D* = 1.57 x 10(-10) cm(2)/s and k* = 4.9 x 10(-8) cm/s; at temperature as low as 350 degrees C. We also observed that at temperatures higher than 500 degrees C, the diffusion length exceeds 10 mu m even for very short exchange times, thus the extrapolation of diffusivity values became uncertain since the physical limit of depth profiling is approached. Our results are compared with existing literature and the discrepancies among the different values are discussed in terms of analysis technique, isotope exchange procedure and micro-structural effects. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：142 / 145

页数：4

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