Low temperature a-Si:H photodiodes and flexible image sensor arrays patterned by digital lithography

被引:54
作者
Ng, Tse Nga [1 ]
Lujan, Rene A. [1 ]
Sambandan, Sanjiv [1 ]
Street, Robert A. [1 ]
Limb, Scott [1 ]
Wong, William S. [1 ]
机构
[1] Palo Alto Res Ctr, Palo Alto, CA 94304 USA
关键词
D O I
10.1063/1.2767981
中图分类号
O59 [应用物理学];
学科分类号
摘要
Hydrogenated amorphous silicon-based image sensor arrays were fabricated on polyethylene naphthalate substrates, with photodiodes optimized for process temperatures of 150 degrees C. An optimal i-layer thickness was determined to minimize carrier recombination and to maintain sufficient light absorption and acceptable leakage current. Patterning of the thin-film transistor backplane was accomplished using ink-jet printed etch masks. A flexible image sensor is demonstrated with 75 dots/in. resolution over 180 x 180 pixels and with sensitivity of 1.2 pW/cm(2). (c) 2007 American Institute of Physics.
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页数:3
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