Transmission electron microscopy analysis of computer hard disc, magnetic thin films

被引：3

作者：

Risner, J

Kwon, U

Park, DW

Sinclair, R ^{[1
]}

机构：

[1] Stanford Univ, Stanford, CA 94305 USA

[2] MMC Technol, San Jose, CA 95131 USA

来源：

MATERIALS CHEMISTRY AND PHYSICS | 2003年 / 81卷 / 2-3期

关键词：

recording media; microstructure; TEM;

D O I：

10.1016/S0254-0584(02)00559-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

As longitudinal magnetic recording media nears the fundamental bit size limit, transmission electron microscopy (TEM) of the microstructure and composition of novel Co-Cr-X media are necessary for further increasing recording density. Grain size determination of B-containing and perpendicular media, and grain boundary segregation are discussed. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：241 / 243

页数：3

共 6 条

[1] High performance CoPtCrO single layered perpendicular media with no recording demagnetization [J].