Origin of non-uniformity in MBE grown nanometer-sized InGaAs ridge quantum wires and its removal by atomic hydrogen-assisted cleaning

被引:18
作者
Muranaka, T [1 ]
Jiang, C
Ito, A
Hasegawa, H
机构
[1] Hokkaido Univ, Res Ctr Interface Quantum Elect, Sapporo, Hokkaido 0608628, Japan
[2] Hokkaido Univ, Grad Sch Elect & Informat Engn, Sapporo, Hokkaido 0608628, Japan
关键词
InP; InGaAs ridge quantum wire; selective molecular beam epitaxy; atomic hydrogen cleaning; in situ X-ray photoelectron spectroscopy; photoluminescence;
D O I
10.1016/S0040-6090(00)01500-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The origin of non-uniformity of MBE-grown InGaAs ridge quantum wires (QWRs) in sub 10-nm wire width range was investigated in detail by SEM, in situ XPS, TEM and PL measurements. InAlAs/InGaAs/InAlAs wires were selectively grown on InGaAs ridge structures prepared also by MBE on [(1) over bar 10] stripe patterned (001) InP substrates. The main source of non-uniformity was thermal cleaning of InP in As, done prior to InGaAs ridge formation which produced ridges having irregular sized InGaAs islands due to an initial As-P exchange reaction. Low temperature atomic hydrogen cleaning removed this problem, and led to successful formation of sub 10-nm QWRs. (C) 2000 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:189 / 191
页数:3
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