Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format

被引：13

作者：

Chan, K ^{[1
]}

Chan, CK ^{[1
]}

Chen, LK ^{[1
]}

Tong, F ^{[1
]}

机构：

[1] Chinese Univ Hong Kong, Dept Informat Engn, Shatin, Hong Kong, Peoples R China

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2003年 / 15卷 / 09期

关键词：

all-optical demultiplexing; optical time-division multiplexing (OTDM); pattern effect; return-to-zero differential phase-shift keying (RZ-DPSK);

D O I：

10.1109/LPT.2003.816701

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this letter, we propose and demonstrate to employ return-to-zero differential phase-shifted-keying (RZ-DPSK) modulation format in optical time-division-multiplexing (OTDM) systems so as to mitigate the pattern-induced degradation in semiconductor optical amplifier-based all-optical demultiplexers. Experimental results prove that RZ-DPSK can effectively alleviate such impairment with negligible induced power penalty, and thus, is more robust than the conventional RZ ON-OFF keying modulation format in OTDM systems.

引用

页码：1264 / 1266

页数：3

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