Reliability of PV modules and balance-of-system components

被引：38

作者：

Dhere, NG ^{[1
]}

机构：

[1] Florida Solar Energy Ctr, Cocoa, FL 32922 USA

来源：

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 | 2005年

关键词：

D O I：

10.1109/PVSC.2005.1488445

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Over the years the reliability and durability of c-Si and thin-film photovoltaic (PV) modules and balance-of-system (BOS) components have improved consistently. This paper reviews performance of PV modules and BOS components and discusses the role of encapsulants, adhesional strength, impurities, metallization, solder bond integrity and breakage, corrosion, backing layers, junction boxes and high-voltage bias testing in relation to their effect on module and inverter reliability. It is suggested that the concepts of physics of reliability of electronic packages will be useful to understand, address and resolve new problems in PV module and inverter reliability.

引用

页码：1570 / 1576

页数：7

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