A new approach to using anisotropically conductive adhesives for flip-chip assembly

被引:23
作者
Lyons, AM
Hall, E
Wong, YH
Adams, G
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] AT&T BELL LABS,WHIPPANY,NJ 07981
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A | 1996年 / 19卷 / 01期
关键词
batch curing fixture; ACA; ACAF; COF; chip on flex;
D O I
10.1109/95.486555
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The use of anisotropically conductive adhesives (ACA's) for the direct interconnection of silicon chips to printed circuits offers numerous advantages including: reduced package thickness, improved environmental compatibility, lowered assembly temperatures, increased metallization options, and decreased equipment needs. To increase throughput and to lower costs, we have developed a new approach to pip-chip assembly with ACA's. Our process uses two unique features: an ACA thixotropic paste formulation and a batch curing fixture. The thixotropic paste, which replaces the more conventional film form of the adhesive, can be easily dispensed onto the substrate with a stencil printer. Chips placed into the ACA paste are held securely due to the ''tacky'' nature of the material much like surface mount components are held by solder pastes. As a result, no heating of the chips is required during assembly, increasing throughput and relaxing co-planarity tolerances in the alignment equipment. As with all ACA's, the paste must be cured by the simultaneous application of heat and pressure. In our process, curing is accomplished in a fixture capable of holding multiple chips and/or circuit boards simultaneously. Uniform pressure is applied to components during the 3-5 min thermal cure cycle via a conformable silicone rubber bladder. Initial yield and temperature cycling data are reported in this paper. Silicon chips with gold metallization show small (<15%) increases in contact resistance after more than 1000 test cycles (between 0-100 degrees C); bumping the chips was not required. Aluminum metallized chips proved to be unreliable after temperature cycling tests.
引用
收藏
页码:5 / 11
页数:7
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