Critical currents in Bi-Sr-Ca-Cu-O superconductors up to 33 T at 4.2 K

被引:19
作者
Weijers, HW [1 ]
ten Haken, B
ten Kate, HHJ
Schwartz, J
机构
[1] Natl High Magnet Field Lab, Tallahassee, FL 32310 USA
[2] FSU, FAMU, Coll Engn, Dept Mech Engn, Tallahassee, FL 32310 USA
关键词
critical current; high magnetic fields; scaling; grain misalignment;
D O I
10.1109/77.919945
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The I-V curves of Bi-Sr-Ca-Cu-O superconductors were measured in DC magnetic fields, oriented both parallel and perpendicular to the tape surface, up to 33 T, 4.2 K, in resistive magnets at the National High Magnetic Field Laboratory. This paper presents the experimental set-up, results of critical current measurements, and an analysis of the obtained I,(B) curves in terms of strongly and weakly linked current paths. A distinct double-step behavior is observed for field perpendicular to the tape surface. The scaling behavior of the applied field with its component perpendicular to the ab-plane, and the implied average grain-misalignment angle, is investigated.
引用
收藏
页码:3956 / 3959
页数:4
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