X-ray measurements of growth rates at a gas interface accelerated by shock waves

A new experimental technique to measure the density of a high atomic number gas at a shock-accelerated interface has been developed and demonstrated. It is based on the absorption of x rays by the high atomic number gas, and it was implemented in a vertical square shock tube. The object of the study was the turbulent entrainment and mixing of shock-accelerated air/xenon interfaces prepared by retracting a metal plate, initially separating the two gases, prior to the release of the shock wave. Interfaces of two types, quasi-sinusoidal and nominally flat, were examined. The amplitude of large wavelength (25-100 mm) perturbations on the interface, and the thickness of the interface were measured. An integral definition for the interface mean line was adopted, making it possible to study and time evolution of the individual Fourier modes of the perturbations. A new integral definition for the interface thickness was proposed, making it feasible to study for the first time the time evolution of the thickness of quasi-sinusoidal interfaces. Images of interfaces after interacting with a series of weak waves reverberating between the interface and the shock tube end wall were obtained. The perturbations are studied at the late stages of their evolution, when their amplitude is no longer small compared to their wavelength. Consequently, the measured growth rates of the modal amplitudes are smaller than those predicted by the impulsive model based on the small amplitude approximation. the case of nominally flat interfaces, the thickness is observed to grow linearly at rates comparable to values previously reported. (C) 1996 American Institute of Physics.