共 13 条
[1]
A metrological scanning force microscope used for coating thickness and other topographical measurements
[J].
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,
1998, 66 (Suppl 1)
:S837-S842
[2]
*CEN, TC1884 CEN
[4]
*EUR COMM SMT, DETERMINATION HARDNE
[5]
Field J.E., 1999, YOUNG MODULUS POISSO
[6]
HASCHE K, 1999, P LAS METR 1999 FLOR
[7]
HASCHE K, 2000, P QUANT MICR 2000 SE, P219
[8]
*ISO CD, 145771 ISOCD
[9]
JAGER G, 1999, P LAS METR 1999 FLOR
[10]
Depth sensing indentation of thin hard films: A study of modulus measurement sensitivity to indentation parameters
[J].
FUNDAMENTALS OF NANOINDENTATION AND NANOTRIBOLOGY,
1998, 522
:239-244