Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single-qubit device

被引：45

作者：

De Martini, F ^{[1
]}

Mazzei, A

Ricci, M

D'Ariano, GM

机构：

[1] Univ Roma La Sapienza, Dipartimento Fis, Ist Nazl Fis Mat, I-00185 Rome, Italy

[2] Ist Nazl Fis Mat, Quantum Opt & Informat Grp, Unita Pavia, I-27100 Pavia, Italy

[3] Dipartimento Fis A Volta, I-27100 Pavia, Italy

[4] Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA

来源：

PHYSICAL REVIEW A | 2003年 / 67卷 / 06期

关键词：

D O I：

10.1103/PhysRevA.67.062307

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present the full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubit device by just replicating the whole experimental setup n times.

引用

页数：5

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