Extended infrared response of silicon solar cells and the impurity photovoltaic effect

被引:35
作者
Keevers, MJ
Green, MA
机构
基金
澳大利亚研究理事会;
关键词
D O I
10.1016/0927-0248(95)00113-1
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Sub-bandgap spectral response measurements on silicon solar cells are used to characterise the infrared response of present devices, and to investigate the impurity photovoltaic (IPV) effect for improving their infrared response. The former has, aside from establishing a baseline case, led to an improved determination of the subgap absorption coefficient of crystalline silicon. Absorption coefficient values as low as 10(-7) cm(-1) have been determined, revealing structure due to 3- and 4-phonon assisted absorption. These values are compared with a more recent determination of the absorption edge based on photoluminescence measurements. The influences of free carrier absorption, bandgap narrowing, and the Franz-Keldysh effect on cell infrared response are considered. Investigation of the IPV effect of indium in high efficiency bulk and thin film cells reveals that indium improves their infrared response. The cross section for electron photoemission from the indium level, a crucial parameter for modelling indium's IPV effect, is determined.
引用
收藏
页码:195 / 204
页数:10
相关论文
共 28 条
[1]  
ASPNES DE, 1988, PROPERTIES SILICON, P72
[2]   A NEW APPROACH TO HIGH-EFFICIENCY MULTI-BAND-GAP SOLAR-CELLS [J].
BARNHAM, KWJ ;
DUGGAN, G .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (07) :3490-3493
[3]  
Basore P. A., 1993, 23 IEEE PHOT SPEC C, P147
[4]   ON THE DETERMINATION OF MINORITY-CARRIER DIFFUSION LENGTH IN THE BASE REGION OF N+-P-P+ SILICON SOLAR-CELLS USING PHOTORESPONSE METHODS [J].
BASU, PK ;
SINGH, SN .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1994, 33 (03) :317-329
[5]   ABSORPTION-COEFFICIENT OF SILICON - AN ASSESSMENT OF MEASUREMENTS AND THE SIMULATION OF TEMPERATURE-VARIATION [J].
BUCHER, K ;
BRUNS, J ;
WAGEMANN, HG .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (02) :1127-1132
[6]  
CHIKOVAN.RI, 1967, FIZ TVERD TELA+, V8, P1856
[7]   URBACH EDGE OF CRYSTALLINE AND AMORPHOUS-SILICON - A PERSONAL REVIEW [J].
CODY, GD .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1992, 141 (1-3) :3-15
[8]   BAND EDGE OPTICAL-ABSORPTION IN INTRINSIC SILICON - ASSESSMENT OF THE INDIRECT TRANSITION AND DISORDER MODELS [J].
CORKISH, R ;
GREEN, MA .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (08) :3988-3996
[9]   ULTRALOW VALUES OF THE ABSORPTION-COEFFICIENT OF SI OBTAINED FROM LUMINESCENCE [J].
DAUB, E ;
WURFEL, P .
PHYSICAL REVIEW LETTERS, 1995, 74 (06) :1020-1023
[10]   PHOTO-VOLTAIC MEASUREMENT OF BANDGAP NARROWING IN MODERATELY DOPED SILICON [J].
DELALAMO, JA ;
SWANSON, RM ;
LIETOILA, A .
SOLID-STATE ELECTRONICS, 1983, 26 (05) :483-489