Direct observation of Na and O impurities at grain surfaces of CuInSe2 thin films

被引：92

作者：

Niles, DW ^{[1
]}

Al-Jassim, M ^{[1
]}

Ramanathan, K ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1999年 / 17卷 / 01期

关键词：

D O I：

10.1116/1.581583

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade CuInSe2 thin films. They give the first direct proof that Na and O reside at grain surfaces and not in the grain interiors of CuInSe2 (CIS) thin films, and discuss the improvement in photovoltaic conversion efficiency of CIS with Na. (C) 1999 American Vacuum Society. [S0734-2101(99)04401-2].

引用

页码：291 / 296

页数：6

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