Growth of giant magnetoresistive spin valves with strong exchange bias field

被引:10
作者
Choe, G [1 ]
Tsoukatos, A [1 ]
Gupta, S [1 ]
机构
[1] Veeco Instruments Inc, PVD Proc Dev, Orangeburg, NY 10962 USA
关键词
D O I
10.1109/20.706294
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
FeMn based spin valves exhibiting high GMR ratio and, high exchange bias field were fabricated by improving the interface roughness as well as the crystallographic texture. A highly oriented (111) NiFe free layer deposited with substrate bias promoted strong (111) textures of Cu and FeMn while maintaining sharp interfaces, resulting in a high exchange bias field, a high blocking temperature, and a high GMR ratio. The correlation between the interlayer coupling energy (J(free-pinned)) and the interface sharpness was studied as a function a Cu spacer thickness for spin valves with free and pinned NiFe layers deposited under various bias conditions.
引用
收藏
页码:867 / 869
页数:3
相关论文
共 7 条
[1]   Structural comparisons of ion beam and de magnetron sputtered spin valves by high-resolution transmission electron microscopy [J].
Bailey, WE ;
Zhu, NC ;
Sinclair, R ;
Wang, SX .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :6393-6395
[2]   NiFe underlayer effects on exchange coupling field and coercivity in NiFe/FeMn films [J].
Choe, G ;
Gupta, S .
IEEE TRANSACTIONS ON MAGNETICS, 1997, 33 (05) :3691-3693
[3]   High exchange anisotropy and high blocking temperature in strongly textured NiFe(111)/FeMn(111) films [J].
Choe, G ;
Gupta, S .
APPLIED PHYSICS LETTERS, 1997, 70 (13) :1766-1768
[4]  
JOO HS, 1995, IEEE T MAGN, V31, P3946, DOI 10.1109/20.489825
[5]   EFFECT OF ENERGETIC PARTICLE BOMBARDMENT DURING SPUTTER-DEPOSITION ON THE PROPERTIES OF EXCHANGE-BIASED SPIN-VALVE MULTILAYERS [J].
KOOLS, JCS .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (07) :2993-2998
[6]   Interlayer coupling in spin valve structures [J].
Leal, JL ;
Kryder, MH .
IEEE TRANSACTIONS ON MAGNETICS, 1996, 32 (05) :4642-4644
[7]   ROLE OF INTERFACIAL MIXING IN GIANT MAGNETORESISTANCE [J].
SPERIOSU, VS ;
NOZIERES, JP ;
GURNEY, BA ;
DIENY, B ;
HUANG, TC ;
LEFAKIS, H .
PHYSICAL REVIEW B, 1993, 47 (17) :11579-11582